Автор: Graham T. Smith Название: Industrial Metrology ISBN: 1849968780 ISBN-13(EAN): 9781849968782 Издательство: Springer Рейтинг: Цена: 25075.00 р. Наличие на складе: Нет в наличии.
Описание: The subject of this book is surface metrology, in particular two major aspects: surface texture and roundness. Traditionally surface metrology usage has been dictated by engineers who have served long and demanding apprenticeships, usually in parallel with studies leading to technician-level qualifications.
Автор: Krishnan, Kannan M. Название: Principles of Materials Characterization and Metrology ISBN: 0198830262 ISBN-13(EAN): 9780198830269 Издательство: Oxford Academ Рейтинг: Цена: 7869.00 р. Наличие на складе: Поставка под заказ.
Описание: This book provides a comprehensive introduction to the principles of materials characterization and metrology. Based on several decades of teaching experience, it includes many worked examples, questions and exercises, suitable for students at the undergraduate or beginning graduate level.
Автор: Graham T. Smith Название: Machine Tool Metrology ISBN: 3319251074 ISBN-13(EAN): 9783319251073 Издательство: Springer Рейтинг: Цена: 21953.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Machine Tools - an Introduction.- Laser Instrumentation and Calibration.- Optical Instrumentation for Machine Calibration.- Telescoping Ballbars and other Diagnostic Intrumentation.- Artefacts for Machine Verification.- Machine Tool Performance - Spindle Analysis; Corrosion and Oil Debris Monitoring; Thermography.- Uncertainty of Measurement and Statistical Process Control.- Machine Tool Reliability.- Total Productive Maintenance (TPM) and Reliability-centred Maintenance (RCM).
Автор: Ferrero Название: Forensic Metrology ISBN: 3031146182 ISBN-13(EAN): 9783031146183 Издательство: Springer Рейтинг: Цена: 14635.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book offers up-to-date information and guidance on the application of metrology in legal proceedings, clarifying the limits of validity of scientific evidence and presenting an illuminating series of case studies in which measurement uncertainty has played an important role. The fundamental concepts of metrology are discussed, and it is explained how metrology is capable of quantifying the reliability of measurement results and thereby contributing to appropriate decision making. With the aid of the presented case studies, this book will assist readers in understanding how legal decisions should be made in the presence of uncertainty. Areas covered in those studies include breath alcohol concentration analysis, and DNA profiling. Nowadays, decisions in most legal cases are based on evidence obtained through scientific analysis involving the acquisition of accurate measurements. Against this background, Forensic Metrology will be of value for lawyers and judges in both civil and common law countries, as well as engineers and other scientists with an interest in the subject.
Автор: Link, Albert N. Название: The Economics and Science of Measurement ISBN: 1032033673 ISBN-13(EAN): 9781032033679 Издательство: Taylor&Francis Рейтинг: Цена: 3061.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Krishnan, Kannan M. Название: Principles of Materials Characterization and Metrology ISBN: 0198830254 ISBN-13(EAN): 9780198830252 Издательство: Oxford Academ Рейтинг: Цена: 16627.00 р. Наличие на складе: Поставка под заказ.
Описание: This book provides a comprehensive introduction to the principles of materials characterization and metrology. Based on several decades of teaching experience, it includes many worked examples, questions and exercises, suitable for students at the undergraduate or beginning graduate level.
Описание: The book describes the implementation of different methods, including artificial neural networks, the Matrix Method, the Monte Carlo method and the virtual CMM (Coordinate Measuring Machine), and demonstrates how these methods can be effectively used in practice to gauge the accuracy of coordinate measurements.
Автор: Magdalena Diering; Micha? Wieczorowski; Christophe Название: Advances in Manufacturing II ISBN: 3030186814 ISBN-13(EAN): 9783030186814 Издательство: Springer Рейтинг: Цена: 12196.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book gathers timely contributions on metrology and measurement systems, across different disciplines and field of applications. The chapters, which were presented at the 6th International Scientific-Technical Conference, MANUFACTURING 2019, held on May 19-21, 2019, in Poznan, Poland, cover cutting-edge topics in surface metrology, biology, chemistry, civil engineering, food science, material science, mechanical engineering, manufacturing, metrology, nanotechnology, physics, tribology, quality engineering, computer science, among others. By bringing together engineering and economic topics, the book is intended as an extensive, timely and practice-oriented reference guide for both researchers and practitioners. It is also expected to foster better communication and closer cooperation between universities and their business and industry partners.
Автор: Ewa Bulska Название: Metrology in Chemistry ISBN: 331999204X ISBN-13(EAN): 9783319992044 Издательство: Springer Рейтинг: Цена: 12196.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In this concise book, the author presents the essentials every chemist needs to know about how to obtain reliable measurement results. Starting with the basics of metrology and the metrological infrastructure, all relevant topics – such as traceability, calibration, chemical reference materials, validation and uncertainty – are covered. In addition, key aspects of laboratory management, including quality management, inter-laboratory comparisons, proficiency testing, and accreditation, are addressed.
Автор: Stephan Stuerwald Название: Digital Holographic Methods ISBN: 3030001687 ISBN-13(EAN): 9783030001681 Издательство: Springer Рейтинг: Цена: 13415.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book presents not only the simultaneous combination of optical methods based on holographic principles for marker-free imaging, real-time trapping, identification and tracking of micro objects, but also the application of substantial low coherent light sources and non-diffractive beams. It first provides an overview of digital holographic microscopy (DHM) and holographic optical tweezers as well as non-diffracting beam types for minimal-invasive, real-time and marker-free imaging as well as manipulation of micro and nano objects.It then investigates the design concepts for the optical layout of holographic optical tweezers (HOTs) and their optimization using optical simulations and experimental methods. In a further part, the book characterizes the corresponding system modules that allow the addition of HOTs to commercial microscopes with regard to stability and diffraction efficiency. Further, based on experiments and microfluidic applications, it demonstrates the functionality of the combined setup, and discusses several types of non-diffracting beams and their application in optical manipulation. The book shows that holographic optical tweezers, including several non-diffracting beam types like Mathieu beams, combined parabolic and Airy beams, not only open up the possibility of generating efficient multiple dynamic traps for micro and nano particles with forces in the pico and nano newton range, but also the opportunity to exert optical torque with special beams like Bessel beams, which can facilitate the movement and rotation of particles by generating microfluidic flows. The last part discusses the potential use of a slightly modified DHM-HOT-system to explore the functionality of direct laser writing based on a two photon absorption process in a negative photoresist with a continuous wave laser
Автор: Forbes Alistair B., Chunovkina Anna, Eichstadt Sascha Название: Advanced Mathematical and Computational Tools in Metrology and Testing XI ISBN: 9813274298 ISBN-13(EAN): 9789813274297 Издательство: World Scientific Publishing Рейтинг: Цена: 24552.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
This volume contains original, refereed contributions by researchers from institutions and laboratories across the world that are involved in metrology and testing. They were adapted from presentations made at the eleventh edition of the Advanced Mathematical and Computational Tools in Metrology and Testing conference held at the University of Strathclyde, Glasgow, in September 2017, organized by IMEKO Technical Committee 21, the National Physical Laboratory, UK, and the University of Strathclyde. The papers present new modeling approaches, algorithms and computational methods for analyzing data from metrology systems and for evaluation of the measurement uncertainty, and describe their applications in a wide range of measurement areas.
This volume is useful to all researchers, engineers and practitioners who need to characterize the capabilities of measurement systems and evaluate measurement data. Through the papers written by experts working in leading institutions, it covers the latest computational approaches and describes applications to current measurement challenges in engineering, environment and life sciences.
Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on ""complete"" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.
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