Diffraction Gratings and Applications, Loewen, Erwin G.
Автор: Igor Minin; Oleg Minin Название: Diffractive Optics and Nanophotonics ISBN: 3319242512 ISBN-13(EAN): 9783319242514 Издательство: Springer Рейтинг: Цена: 6097.00 р. Наличие на складе: Нет в наличии.
Описание: In this book the authors present several examples of techniques used to overcome the Abby diffraction limit using flat and 3D diffractive optical elements, photonic crystal lenses, photonic jets, and surface plasmon diffractive optics.
Автор: Ersoy, Okan K. Название: Diffraction, Fourier Optics and Imaging ISBN: 0471238163 ISBN-13(EAN): 9780471238164 Издательство: Wiley Рейтинг: Цена: 22326.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Fourier and Diffractive Optics is a required course in electrical engineering and physics programs. Based upon Professor Ersoy`s class notes, Diffraction, Fourier Optics and Imaging is an innovative and comprehensive work, presenting both theory and applications using MATLAB in examples and exercises.
Автор: Vartziotis, Dimitris (NIKI Digital Engineering, Greece and TWT GmbH Science and Innovation, Germany) Wipper, Joachim Название: X-Ray Diffraction Imaging ISBN: 1032094273 ISBN-13(EAN): 9781032094274 Издательство: Taylor&Francis Рейтинг: Цена: 9339.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Coherent scattering mechanism forms a basis of the x-ray diffraction imaging that is a subject of this book. The x-ray diffraction technology and its various applications in medical, industrial and security fields are also covered.
Автор: Masayoshi Nakasako Название: X-Ray Diffraction Imaging of Biological Cells ISBN: 4431568670 ISBN-13(EAN): 9784431568674 Издательство: Springer Рейтинг: Цена: 20733.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In this book, the author describes the development of the experimental diffraction setup and structural analysis of non-crystalline particles from material science and biology. Recent advances in X-ray free electron laser (XFEL)-coherent X-ray diffraction imaging (CXDI) experiments allow for the structural analysis of non-crystalline particles to a resolution of 7 nm, and to a resolution of 20 nm for biological materials. Now XFEL-CXDI marks the dawn of a new era in structural analys of non-crystalline particles with dimensions larger than 100 nm, which was quite impossible in the 20th century. To conduct CXDI experiments in both synchrotron and XFEL facilities, the author has developed apparatuses, named KOTOBUKI-1 and TAKASAGO-6 for cryogenic diffraction experiments on frozen-hydrated non-crystalline particles at around 66 K. At the synchrotron facility, cryogenic diffraction experiments dramatically reduce radiation damage of specimen particles and allow tomography CXDI experiments. In addition, in XFEL experiments, non-crystalline particles scattered on thin support membranes and flash-cooled can be used to efficiently increase the rate of XFEL pulses. The rate, which depends on the number density of scattered particles and the size of X-ray beams, is currently 20-90%, probably the world record in XFEL-CXDI experiments. The experiment setups and results are introduced in this book. The author has also developed software suitable for efficiently processing of diffraction patterns and retrieving electron density maps of specimen particles based on the diffraction theory used in CXDI.
Автор: Ufimtsev Название: Physical Theory of Diffraction, 2nd Edition ISBN: 1118753666 ISBN-13(EAN): 9781118753668 Издательство: Wiley Рейтинг: Цена: 20267.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: A complete presentation of the modern physical theory of diffraction and its applications, by the world s leading authority on the topic, Physical Theory of Diffraction, Second Edition is a must-have for graduate students, researchers, and engineers in academia and industry.
Описание: The book explains the classification of a set of Walsh functions into distinct self-similar groups and subgroups, where the members of each subgroup possess distinct self-similar structures.
Автор: Andronov Название: Problems of High Frequency Diffraction by Elongated Bodies ISBN: 981991275X ISBN-13(EAN): 9789819912759 Издательство: Springer Рейтинг: Цена: 15855.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Classical asymptotic expansions, while producing a good approximation for the diffracted fields in general, appear hardly applicable in the case of extremely elongated bodies. Thus, there are problems that are on the one hand too difficult for numerical solvers due to large system size, and on the other hand make the description with classical asymptotic methods hard. The book explains why this happens and suggests the way out. By defining the characteristics of a strongly elongated body it introduces a special class of asymptotic approximations, which are in some sense uniform with respect to the rate of body elongation. Chapter 1 briefly describes the results of V. A. Fock and further developments of his approach towards the problems of diffraction by elongated obstacles. It formulates the cases of moderately and strongly elongated bodies. The rest of the book describes the approach of special parabolic equations, which lead to new asymptotic approximations for the diffracted fields. Chapters 2, 3 and 4 discuss diffraction by bodies of elliptical shape: The elliptic cylinder with a strongly elongated cross section and prolate spheroid with a high aspect ratio. Chapter 5 generalizes the approach to some other shapes such as narrow cones and narrow hyperboloids. Mathematical formulas for the Whittaker functions widely used in the book are collected in the Appendix. The concise derivations are supplied with numerous test examples that compare asymptotic approximations with numerically computed fields and clarify the specifics of high frequency diffraction by strongly elongated bodies. The reference solutions presented in the book enable one to validate the newly developed numerical solvers.
Автор: Nakasako Название: X-Ray Diffraction Imaging of Biological Cells ISBN: 4431566163 ISBN-13(EAN): 9784431566168 Издательство: Springer Рейтинг: Цена: 20733.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In this book, the author describes the development of the experimental diffraction setup and structural analysis of non-crystalline particles from material science and biology. Recent advances in X-ray free electron laser (XFEL)-coherent X-ray diffraction imaging (CXDI) experiments allow for the structural analysis of non-crystalline particles to a resolution of 7 nm, and to a resolution of 20 nm for biological materials. Now XFEL-CXDI marks the dawn of a new era in structural analys of non-crystalline particles with dimensions larger than 100 nm, which was quite impossible in the 20th century. To conduct CXDI experiments in both synchrotron and XFEL facilities, the author has developed apparatuses, named KOTOBUKI-1 and TAKASAGO-6 for cryogenic diffraction experiments on frozen-hydrated non-crystalline particles at around 66 K. At the synchrotron facility, cryogenic diffraction experiments dramatically reduce radiation damage of specimen particles and allow tomography CXDI experiments. In addition, in XFEL experiments, non-crystalline particles scattered on thin support membranes and flash-cooled can be used to efficiently increase the rate of XFEL pulses. The rate, which depends on the number density of scattered particles and the size of X-ray beams, is currently 20-90%, probably the world record in XFEL-CXDI experiments. The experiment setups and results are introduced in this book. The author has also developed software suitable for efficiently processing of diffraction patterns and retrieving electron density maps of specimen particles based on the diffraction theory used in CXDI.
Автор: Jian Min Zuo; John C.H. Spence Название: Advanced Transmission Electron Microscopy ISBN: 1493982494 ISBN-13(EAN): 9781493982493 Издательство: Springer Рейтинг: Цена: 10976.00 р. Наличие на складе: Нет в наличии.
Описание: As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy.
Автор: Alexander Potylitsyn; Mikhail Ivanovich Ryazanov; Название: Diffraction Radiation from Relativistic Particles ISBN: 3642265464 ISBN-13(EAN): 9783642265464 Издательство: Springer Рейтинг: Цена: 18294.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book deals with diffraction radiation, which implies the boundary problems of electromagnetic radiation theory. It presents different analytical models of diffraction radiation and results of recent experimental studies.
Автор: S.J.L. Billinge; M.F. Thorpe Название: Local Structure from Diffraction ISBN: 0306458276 ISBN-13(EAN): 9780306458279 Издательство: Springer Рейтинг: Цена: 25077.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This series of books, which is published at the rate of about one per year, addresses fundamental problems in materials science. The contents cover a broad range of topics from small clusters of atoms to engineering materials and involve chemistry, physics, materials science and engineering, with length scales ranging from ngstroms up to millimeters. The emphasis is on basic science rather than on applications. Each book focuses on a single area of current interest and brings together leading experts to give an up-to-date discussion of their work and the work of others. Each article contains enough references that the interested reader can access the relevant literature. Thanks are given to the Center for Fundamental Materials Research at Michigan State University for supporting this series. M.F. Thorpe, Series Editor E-mail: thorpe @ pa.msu.edu East Lansing, Michigan PREFACE One of the most challenging problems in the study of structure is to characterize the atomic short-range order in materials. Long-range order can be determined with a high degree of accuracy by analyzing Bragg peak positions and intensities in data from single crystals or powders. However, information about short-range order is contained in the diffuse scattering intensity. This is difficult to analyze because it is low in absolute intensity (though the integrated intensity may be significant) and widely spread in reciprocal space.
Название: X-Ray Diffraction Imaging ISBN: 1498783619 ISBN-13(EAN): 9781498783613 Издательство: Taylor&Francis Рейтинг: Цена: 25265.00 р. Наличие на складе: Нет в наличии.
Описание: Coherent scattering mechanism forms a basis of the x-ray diffraction imaging that is a subject of this book. The x-ray diffraction technology and its various applications in medical, industrial and security fields are also covered.
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