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Atomic Force Microscopy In Process Engineering, Bowen, Richard


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Автор: Bowen, Richard
Название:  Atomic Force Microscopy In Process Engineering
ISBN: 9781856175173
Издательство: Elsevier Science
Классификация:

ISBN-10: 1856175170
Обложка/Формат: Hardback
Страницы: 304
Вес: 0.57 кг.
Дата издания: 03.07.2009
Язык: English
Размер: 239 x 159 x 19
Читательская аудитория: Professional & vocational
Основная тема: Chem Eng&Plant
Подзаголовок: An introduction to afm for improved processes and products
Ссылка на Издательство: Link
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Поставляется из: Европейский союз
Описание: Brings together both the basic theory and proven process engineering practice of AFM. This book takes a rigorous and practical approach that ensures it is directly applicable to process engineering problems. It describes fundamentals and techniques, while specific benefits for process engineering are clearly defined and illustrated.


Atomic Force Microscopy/Scanning Tunneling Microscopy 3

Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 3
ISBN: 0306462974 ISBN-13(EAN): 9780306462979
Издательство: Springer
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Цена: 20516.00 р.
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Описание: Contains the proceedings of the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium, which was held to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies.

Noncontact Atomic Force Microscopy

Автор: Seizo Morita; Franz J. Giessibl; Ernst Meyer; Rola
Название: Noncontact Atomic Force Microscopy
ISBN: 3319155873 ISBN-13(EAN): 9783319155876
Издательство: Springer
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Цена: 17097.00 р.
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Описание: Noncontact Atomic Force Microscopy

Atomic Force Microscopy/Scanning Tunneling Microscopy

Автор: M.T. Bray; Samuel H. Cohen; Marcia L. Lightbody
Название: Atomic Force Microscopy/Scanning Tunneling Microscopy
ISBN: 0306448904 ISBN-13(EAN): 9780306448904
Издательство: Springer
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Цена: 22797.00 р.
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Описание: In the first session, Biological Nanostructure, topics ranged from AFM ofDNA to STM imagmg ofthe biomoleeule tubulin and bacterialluciferase to the AFM of starch polymer double helices to AFM imaging of food surfaces.

Atomic Force Microscopy/Scanning Tunneling Microscopy 2

Автор: Samuel H. Cohen; Marcia L. Lightbody
Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 2
ISBN: 030645596X ISBN-13(EAN): 9780306455964
Издательство: Springer
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Цена: 19376.00 р.
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Описание: Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994

Atomic Force Microscopy: Biological Aspects

Автор: Wright Kate
Название: Atomic Force Microscopy: Biological Aspects
ISBN: 1632380595 ISBN-13(EAN): 9781632380593
Издательство: Неизвестно
Цена: 24943.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Atomic force microscopy

Название: Atomic force microscopy
ISBN: 149398893X ISBN-13(EAN): 9781493988938
Издательство: Springer
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Цена: 15855.00 р.
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Описание: This book aims to provide examples of applications of atomic force microscopy (AFM) using biological samples, showing different methods for AFM sample preparation, data acquisition and processing, and avoiding technical problems. Divided into two sections, chapters guide readers through image artifacts, process and quantitatively analyze AFM images, lipid bilayers, image DNA-protein complexes, AFM cell topography, single-molecule force spectroscopy, single-molecule dynamic force spectroscopy, fluorescence methodologies, molecular recognition force spectroscopy, biomechanical characterization, AFM-based biosensor setup, and detail how to implement such an in vitro system, which can monitor cardiac electrophysiology, intracellular calcium dynamics, and single cell mechanics. Written in the highly successful Methods in Molecular Biology series format, chapters include introductions to their respective topics, lists of the necessary materials and reagents, step-by-step, readily reproducible laboratory protocols, and tips on troubleshooting and avoiding known pitfalls.Authoritative and cutting-edge, Atomic Force Microscopy: Methods and Protocols is useful for researchers at different stages, from newcomers to experienced users, interested in new AFM applications.

Atomic force microscopy

Автор: Sanders, Wesley C. (salt Lake Community College, Ut, Usa)
Название: Atomic force microscopy
ISBN: 036721864X ISBN-13(EAN): 9780367218645
Издательство: Taylor&Francis
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Цена: 12401.00 р.
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Описание: This book focuses primarily on the atomic force microscope, and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester long, introductory course in atomic force microscopy.

Atomic Force Microscopy

Автор: Voigtlдnder Bert
Название: Atomic Force Microscopy
ISBN: 3030136566 ISBN-13(EAN): 9783030136567
Издательство: Springer
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Цена: 18294.00 р.
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Описание: This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope.

High-Speed Atomic Force Microscopy in Biology: Directly Watching Dynamics of Biomolecules in Action

Автор: Ando Toshio
Название: High-Speed Atomic Force Microscopy in Biology: Directly Watching Dynamics of Biomolecules in Action
ISBN: 3662647834 ISBN-13(EAN): 9783662647837
Издательство: Springer
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Цена: 18294.00 р.
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Описание: This first book on high-speed atomic force microscopy (HS-AFM) is intended for students and biologists who want to use HS-AFM in their research. It provides straightforward explanations of the principle and techniques of AFM and HS-AFM. Numerous examples of HS-AFM studies on proteins demonstrate how to apply this new form of microscopy to specific biological problems. Several precautions for successful imaging and the preparation of cantilever tips and substrate surfaces will greatly benefit first-time users of HS-AFM. In turn, the instrumentation techniques detailed in Chapter 4 can be skipped, but will be useful for engineers and scientists who want to develop the next generation of high-speed scanning probe microscopes for biology. The book is intended to facilitate the first-time use of this new technique, and to inspire students and researchers to tackle their own specific biological problems by directly observing dynamic events occurring in the nanoscopic world. Microscopy in biology has recently entered a new era with the advent of high-speed atomic force microscopy (HS-AFM). Unlike optical microscopy, electron microscopy, and conventional slow AFM, it allows us to directly observe biological molecules in physiological environments. Molecular “movies” created using HS-AFM can directly reveal how molecules behave and operate, without the need for subsequent complex analyses and roundabout interpretations. It also allows us to directly monitor morphological change in live cells, and dynamic molecular events occurring on the surfaces of living bacteria and intracellular organelles. As HS-AFM instruments were recently commercialized, in the near future HS-AFM is expected to become a common tool in biology, and will enhance and accelerate our understanding of biological phenomena.

Amplitude Modulation Atomic Force Microscopy

Автор: Garc?a
Название: Amplitude Modulation Atomic Force Microscopy
ISBN: 3527408347 ISBN-13(EAN): 9783527408344
Издательство: Wiley
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Цена: 20592.00 р.
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Описание: Filling a gap in the literature of its field, this book provides an introduction to the theory, instrumental aspects and applications of amplitude modulation AFM in academia and industry with examples from material science, soft condensed matter, molecular biology, and biophysics.

Atomic Force Microscopy: Exploring Basic Modes and Advanced Applications

Автор: Haugstad
Название: Atomic Force Microscopy: Exploring Basic Modes and Advanced Applications
ISBN: 0470638826 ISBN-13(EAN): 9780470638828
Издательство: Wiley
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Цена: 20901.00 р.
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Описание: This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM).

Confocal microscopy

Автор: Liu, Jian Tan, Jiubin
Название: Confocal microscopy
ISBN: 1681743361 ISBN-13(EAN): 9781681743363
Издательство: Mare Nostrum (Eurospan)
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Цена: 6237.00 р.
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Описание: The confocal microscope is appropriate for imaging cells or the measurement of industrial artefacts. However, junior researchers and instrument users sometimes misuse imaging concepts and metrological characteristics, such as position resolution in industrial metrology and scale resolution in bio-imaging. And, metrological characteristics or influence factors in 3D measurement such as height assessment error caused by 3D coupling effect are so far not yet identified. In this book, the authors outline their practices by the working experiences on standardization and system design. This book assumes little previous knowledge of optics, but rich experience in engineering of industrial measurements, in particular with profile metrology or areal surface topography will be very helpful to understand the theoretical concerns and value of the technological advances. It should be useful for graduate students or researchers as extended reading material, as well as microscope users alongside their handbook.


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