Double-Prism Multi-mode Scanning: Principles and Technology, Anhu Li

Автор: Bharat Bhushan
Название: Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
ISBN: 3662506017 ISBN-13(EAN): 9783662506011
Издательство: Springer
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Цена: 25075.00 р.
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Описание: The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.

Автор: Chunli Bai
Название: Scanning Tunneling Microscopy and Its Application
ISBN: 3642085008 ISBN-13(EAN): 9783642085000
Издательство: Springer
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Цена: 22796.00 р.
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Описание: Scanning Tunneling Microscopy and its Application presents a unified view of the rapidly growing field of STM, and its many derivatives. A thorough discussion of the various principles provides the background to tunneling phenomena and leads to the many novel scanning-probe techniques, such as AFM, MFM, BEEM, PSTM, etc. After having examined the available instrumentation and the methods for tip and surface preparations, the monograph provides detailed accounts of STM application to metal and semiconductor surfaces, adsorbates and surface chemistry, biology, and nanofabrication. It examines limitations of the present-day investigations and provides hints about possible further trends. This second edition includes important new developments in the field.

Автор: Bert Voigtl?nder
Название: Scanning Probe Microscopy
ISBN: 3662505576 ISBN-13(EAN): 9783662505571
Издательство: Springer
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Цена: 15957.00 р.
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Описание: This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope.

Автор: Bharat Bhushan; Harald Fuchs
Название: Applied Scanning Probe Methods IV
ISBN: 364206597X ISBN-13(EAN): 9783642065972
Издательство: Springer
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Цена: 20733.00 р.
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Описание: Scanning Probe Lithography for Chemical, Biological and Engineering Applications.- Nanotribological Characterization of Human Hair and Skin Using Atomic Force Microscopy (AFM).- Nanofabrication with Self-Assembled Monolayers by Scanning Probe Lithography.- Fabrication of Nanometer-Scale Structures by Local Oxidation Nanolithography.- Template Effects of Molecular Assemblies Studied by Scanning Tunneling Microscopy (STM).- Microfabricated Cantilever Array Sensors for (Bio-)Chemical Detection.- Nano-Thermomechanics: Fundamentals and Application in Data Storage Devices.- Applications of Heated Atomic Force Microscope Cantilevers.

Автор: Francesco Marinello; Daniele Passeri; Enrico Savio
Название: Acoustic Scanning Probe Microscopy
ISBN: 3642430791 ISBN-13(EAN): 9783642430794
Издательство: Springer
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Цена: 14817.00 р.
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Описание: This comprehensive presentation of a powerful new technology deals with everything from basic theoretical explanations to calibration, enhancement, and applications. It also compares the advantages of the process to more established scanning probe methods.

Автор: Bharat Bhushan
Название: Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
ISBN: 3662507250 ISBN-13(EAN): 9783662507254
Издательство: Springer
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Цена: 17096.00 р.
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Описание: With chapters contributed by leading researchers, this comprehensive overview of the latest applied scanning probe techniques includes a strong section on biological applications and includes material from a number of industries for a fuller perspective.

Автор: Bharat Bhushan; Harald Fuchs; Masahiko Tomitori
Название: Applied Scanning Probe Methods X
ISBN: 3642093426 ISBN-13(EAN): 9783642093425
Издательство: Springer
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Цена: 23778.00 р.
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Описание: The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.

Автор: Tanaka Nobuo
Название: Scanning Transmission Electron Microscopy of Nanomaterials
ISBN: 184816789X ISBN-13(EAN): 9781848167896
Издательство: World Scientific Publishing
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Цена: 30888.00 р.
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Описание: The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This title covers achievements in the field of STEM obtained with advanced technologies.

Автор: Nicolas Brodusch; Hendrix Demers; Raynald Gauvin
Название: Field Emission Scanning Electron Microscopy
ISBN: 9811044325 ISBN-13(EAN): 9789811044328
Издательство: Springer
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Цена: 6707.00 р.
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Описание: This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution.